Measurement of trace components using D/teX Ultra

The MiniFlex300/600 can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. By using this detector, it is possible to obtain intensity a few tens to roughly 100 times greater than a scintillation counter. Using this feature, it is possible to greatly reduce measurement time, detect trace components, and measure micro-samples with high sensitivity. Fig. 1 shows the diffraction profiles obtained with a scintillation counter and the D/teX Ultra high-speed 1-dimensional detector. The D/teX Ultra detector measures data faster because it can measure a wide range of 2θ simultaneously with good angular resolution.

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Fig. 1: Diffraction profiles when using a scintillation
counter and high-speed 1-dimensional detector

Fig. 2 shows the results of quantifying an extreme trace amount of anatase contained in a rutile reagent using the standard addition method (measurement time 1 minute for 1 sample). As a result of measurement, it was found that the rutile reagent contains about 0.14 mass% of anatase. In this way, using the D/teX Ultra high-speed 1-dimensional detector enables evaluation with good sensitivity and a short measurement time of trace components contained at a rate of 1 mass% or less. 

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Fig. 2: X-ray diffraction pattern and quantitative analysis results for
trace anatase contained in rutile reagent

Apparatus condition:

Apparatus conditions: MiniFlex600 (F.F tube 40 kV, 15 mA), Detector: D/teX Ultra, Slit conditions: DS = 1.25°, SS = 8 mm, RS = 13mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm

Measurement condition:

Scan range: 2θ = 24.9 ~ 25.6°, Step width: 0.02°, Scan speed: 1° / min. (about 1 min.)

MiniFlexNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more about Rigaku's MiniFlex...

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