Measurement with fluorescent X-ray reduction mode of D/teX Ultra

The MiniFlex300/600 can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. This detector energy resolution, so fluorescent X-rays can be removed from the diffraction pattern without using a diffracted beam monochromator. Fig. 1 shows the X-ray diffraction patterns from measuring hematite in the standard energy range (standard mode) and the energy range enabling removal of fluorescent X-rays due to iron (fluorescent X-ray reduction mode).

Fig. 1: X-ray diffraction patterns for hematite, measured in
standard mode and fluorescent X-ray reduction mode

Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for Fe oxide, measured using a graphite monochromator. By using a graphite monochromator, it is possible to obtain an X-ray diffraction pattern with an extremely low background, and thereby detect trace components.

Fig. 2: Results of qualitative analysis of iron ore

Apparatus condition:

Apparatus conditions: MiniFlex600 (F.F tube 40 kV 15mA), Detector: D/teX Ultra, Slit conditions: DS = 1.25°, SS = 8 mm, RS = 13mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm

Measurement condition:

Scan range: 2θ = 10 ~ 60°, Step width: 0.02°, Scan speed: 20° / min. (about 3 min.)

The fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package. Read more...

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