Measurement with fluorescent X-ray reduction mode of D/teX Ultra

The MiniFlex300/600 can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. This detector energy resolution, so fluorescent X-rays can be removed from the diffraction pattern without using a diffracted beam monochromator. Fig. 1 shows the X-ray diffraction patterns from measuring hematite in the standard energy range (standard mode) and the energy range enabling removal of fluorescent X-rays due to iron (fluorescent X-ray reduction mode).


Fig. 1: X-ray diffraction patterns for hematite, measured in
standard mode and fluorescent X-ray reduction mode

Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for Fe oxide, measured using a graphite monochromator. By using a graphite monochromator, it is possible to obtain an X-ray diffraction pattern with an extremely low background, and thereby detect trace components.


Fig. 2: Results of qualitative analysis of iron ore

Apparatus condition:

Apparatus conditions: MiniFlex600 (F.F tube 40 kV 15mA), Detector: D/teX Ultra, Slit conditions: DS = 1.25°, SS = 8 mm, RS = 13mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm

Measurement condition:

Scan range: 2θ = 10 ~ 60°, Step width: 0.02°, Scan speed: 20° / min. (about 3 min.)


New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more...

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