Duct tape specimens

Pictured below is a diffractogram comparing the adhesive side of duct tape from different manufacturers. It is used as part of the material identification in forensic labs as every manufacturer uses a slightly different adhesive and a slightly different upper refractory surface with a different web support structure. An XRD scan of the upper surface, using Rigaku's MiniFlex benchtop diffractometer, combined with a scan of the adhesive side is sufficient to identify the duct tape to a specific manufacturer. Duct tape is one of the most common pieces of evidence left behind at crime scenes.


New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more...

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