General XRD phase/composition identification analysis

General X-ray diffraction phase/composition identification will distinguish the major, minor, and trace compounds present in a sample. The data usually includes mineral (common) name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. A summary table of analysis results and diffraction plot with reference pattern markers for visual comparison is shown below:


Major phases
Minor phases
Trace phases
Anhydrite, CaSO4 -orthorhombic ICDD # 72-0916 Gypsum, syn CaSO4.2H2O -monoclinic ICDD# 33-031 Calcite, syn CaCO3 -rhombohedral ICDD # 05-0586 Brucite, Mg(OH)2 - hexagonal ICDD# 74-2220 Portlandite, syn, Ca(OH)2 -hexagonal ICDD# 44-1181 Quartz, SiO2 - hexagonal ICDD# 64-0312

General X-ray diffraction phase identification and bulk elemental X-ray fluorescence are complimentary analyses, which provide elemental composition and chemical phase and crystal structures actually present in a sample.

New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more...

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