Automated multipurpose X-ray diffractometer (XRD) with Guidance software

Powder diffraction, thin film metrology, SAXS, in-plane scattering, operando measurements


Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

XRD engineered for performance

This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measure­ment modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information.

The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).

XRD designed for usability

Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

XRD that is functionality redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component - software or hardware - fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).

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  • Available in-plane arm (5-axis goniometer)
  • Highest flux X-ray source: PhotonMax
  • HyPix-3000 high energy resolution 2D HPAD detector
  • New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
  • Operando measurements with SmartLab Studio II software
  • Multi-year component warranty contributes to low cost of ownership

New integrated software package for SmartLab systems

One-stop software package for both measurements and analyses

SmartLab Studio II is a new software package that integrates all the measurements and analyses you need on the SmartLab. You can focus on your X-ray analysis without wasting time, since the start-up time of SmartLab Studio II and the number of logins are minimized. Just one click switches from measurement to analysis. You can also watch scans from one experiment in real-time while simultaneously analyzing other data on the same desktop by selecting an appropriate layout.


User Guidance

User Guidance, which incorporates the acquired knowledge and experience of Rigaku application scientists, will lead you to the absolute best data. It selects the best optics for each application and performs the optics alignment automatically. User Guidance then automatically aligns the sample and generates the necessary measurement conditions, even for complicated measurements. A Package, which is an automated measurement sequence, has all the information that the measurement requires. Some Packages for hardware maintenance are preinstalled so users won't have to perform manual optics alignment or detector adjustment after changing sealed tubes, for example. And users can create their own Packages , which can be saved for future use at any time.


Most analysis conditions are determined by SmartLab Studio II based on the loaded data, so novice users can obtain as good analysis results as possible. Furthermore, SmartLab Studio II prepares various parameters and enables you to set more detailed conditions than before, which will satisfy advanced-level users. Since SmartLab Studio II is an integrated software package, basic software features like user administration, materials database, etc. are completely unified. This minimizes the time needed to learn how to use the software. Sophisticated features, such as new graphics and report creation, are also easy to master, and will strongly support you in evaluating your analysis results, preparing attractive presentations, and so forth.

Database and network licensing

Measurement data and analysis results are stored in a database that comes equipped with powerful utilities for data retrieval, data browsing, data backup, etc. This is especially beneficial when managing the large numbers of huge data images obtained using a 2D detector. And now a network license is available for SmartLab Studio II. If a lot of users use the same SmartLab system, the management of a large number of data can easily be centralized by using both database and network licensing.

Graphite/Graphene Analytical Index; GG Index

The GG Index is an analytical tool for the characterization and identification of graphite-based carbon materials.

Target materials: natural graphite, artificial graphite and carbon black from petro or coal derivatives, expanded graphite, graphite/graphene oxides, graphene intermediates, graphene, etc.

Required system: SmartLab (9 kW), automated multi-purpose X-ray diffractometer

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