Benchtop single element wavelength dispersive XRF analyzer
High-precision, high-sensitivity elemental analysis
Mini-Z series
A series of compact benchtop wavelength dispersive XRF analyzers, the Mini-Z series of analyzers are designed for analyzing specific single elements. Since the optics are optimally configured to a particular element, this series allows for high precision and low detection limits.
High precision single element analysis
Mini-Z can be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating), a Cl analyzer, a P analyzer (e.g., biofuels) or a Zr analyzer (e.g., for Zr coating).Self contained elemental analyzer
The Rigaku Mini-Z series benchtop WDXRF spectrometers are completely contained X-ray generating systems. Interlocks and safety "X-RAY ON" indicators are present to protect operators from exposure to X-rays being produced. The spectrometers meet all North American safety codes and are CE marked.Mini-Z series specifications
Metric | Al analyzer | Si analyzer | Cl analyzer | P analyzer | Zr analyzer | Ni analyzer |
X-ray tube | Compact air-cooled Pd target X-ray tube |
Compact air-cooled Pd target X-ray tube |
Compact air-cooled Pd target X-ray tube |
Compact air-cooled Pd target X-ray tube |
Compact air-cooled Pd target X-ray tube |
Compact air-cooled Pd target X-ray tube |
Analyzing crystal | RX4 | RX4 | RX4 | RX4 | RX9 | LIF(200) |
Detector | S-PC | S-PC | S-PC | S-PC | S-PC | S-PC |
Analysis area | 30 mm diameter | 30 mm diameter | 30 mm diameter | 30 mm diameter | 30 mm diameter | 30 mm diameter |
Sample chamber | 6-sample turret | 6-sample turret | 6-sample turret | 6-sample turret | special | special |
Ground | Ground resistance 30 Ω or less | |||||
Ambient condition | Room temperature: 15-28°C (daily variation: less than 2°C), Humidity: less than 75% RH |
|||||
Gas | He (flow rate: 100 mL/min) | Dry air (flow rate: 50 mL/min) |