RESE SmartLab training

SmartLab training: General Scope

This course addresses the basic operations in terms of hardware and software for the SmartLab multi-purpose XRD instrument. The training is based on hands-on solving of example problems in order to illustrate a range of XRD techniques. Starting from basic general purpose powder X-ray diffraction right through to pole figure, residual stress, SAXS and thin-film X-ray diffraction including X-ray reflectivity, grazing incidence diffraction, in-plane diffraction and high-resolution diffraction using PDXL, 3D Explore and Global Fit software. Previous experience in X-ray diffraction is required. Persons attending the training should expect to leave the course with a basic working knowledge of both the SmartLab hardware and analysis software. Some of the specific topics covered are outlined below.

Rigaku will provide the training venue, printed training notes, light refreshment and a course certificate. Persons attending the training are strongly advised to bring their own personal computer with software installation and software dongle that is required to run the software.

Who Should Attend

Operators, engineers, research scientists and university students in university and operators of the SmartLab diffractometer supplied by Rigaku.

Course Agenda


Day 1

Introduction RESE and participants and X-Ray basics (1 h 30 min)
XRD basics and First look - SmartLab (1 h 30 min)
"Hands on SmartLab" practical usage Part 1 (1 h 45 min) /Alignment and Powder diffraction BB, Sample preparation
"Hands on SmartLab" practical usage Part 2 (2 h 00 min) /Powder diffraction and diffraction on bulk samples PB

Day 2

Hands on PDXL - Part 1 (1 h 30 min) /PDXL Basic package, PDXL Qualitative and PDXL Quantitative
"Hands on SmartLab" practical usage Part 3 (1 h 30 min) /SC vs. D/teX, K beta Filter, Monochromator, D/teX XRF reduction mode
Hands on PDXL - Part 2 (1 h 45 min) /PDXL Comprehensive Analysis, Crystallinity
"Hands on SmartLab" practical usage Part 4 (2 h 00 min) /High resolution powder diffraction

Day 3: (training class will be split in two parallel sessions)

Session 1:
"Hands on SmartLab" practical usage Part 5 (1 h 45 min) /High-resolution powder diffraction on real samples
“Hands on PDXL” - Part 3 (1 h 30 min) /PDXL Comprehensive Rietveld Analysis on measured samples
"Hands on SmartLab" practical usage Part 6 (2 h 00 min) /Grazing Incident Diffraction, optimization of measurement conditions
“Hands on PDXL” Part 3 (1 h 15 min) /Data treatment, Fundamental Parameters method
Session 2:
Residual Stress - Part 1 (0 h 45 min) /Theory and measurement conditions
"Hands on SmartLab " Residual Stress - Part 1 (1 h 00 min)
"Hands on SmartLab " Residual Stress - Part 2 (0 h 45 min)
Residual Stress - Part 2 (0 h 45 min) /Analysis of measured data with PDXL Residual Stress Software
Pole Figure measurements - Part 1(0 h 45 min) /Theory and measurement conditions
"Hands on SmartLab " Pole Figure of Al - Part 1 (1 h 00 min)
"Hands on SmartLab " Pole Figure of Al - Part 2 (0 h 45 min) Pole Figure - Part 3 (1 h 00 min) /Analysis of measured data with 3D-Explore Software

Day 4: (training class will be split in two parallel sessions)

Session 1:
Powder XRD with 2D detector Part 1 (1 h 45 min) /2DSAXS/WAXS -Theory and measurements condition
Powder XRD with 2D detector Part 2 (1 h 30 min) /Measurements in scanning mode, data processing
Powder XRD with 2D detector Part 3 (1 h 15 min) /Measurements in static mode
Powder XRD with 2D detector Part 4 (1 h 45 min) /Measurements and data processing
Session 2:
Thin Film XRD with 2D detector Part 1 (1 h 45 min) /2D-GISAXS -Theory and measurements condition
Thin Film XRD with 2D detector Part 2 (1 h 30 min) /2D-GISAXS data processing Wide-range RSM with 2D detector Part 1 (1 h 15 min) /Measurements and data processing In-plane diffraction Part 1 (1 h 45 min) /Measurements and data processing

Day 5: (training class will be split in two parallel sessions)

Session 1:
SAXS Part 1 - Theory and measurements (1 h 45 min)
SAXS Part 2 - Data analysis with NANO-Solver software (1 h 30 min)
SAXS/USAXS (Part3) - Theory and measurements (1 h 45 min)
Questions and Answers…
Session 2:
Thin Film Part 1 – In-plane vs. Grazing incidence diffraction (1 h 45 min)
Thin Film Part 2 - XRR (30 min)
Thin Film Part 3 – XRR Data analysis with GlobalFit software (45 min)
Thin Film Part 5 - HR-XRD (1 h 45 min)
Thin Film Part 6 - HR-XRD Data analysis with GlobalFit software (1 h 00 min)

16:00 – 17:00 Common discussions. Summary of the training.

Note: During training course, the latest version of software for instrument control and analysis software that is available on the market is used. Therefore, details of the operation might be different from your environment. Our trainers are more than happy to discuss the operations on your version of the software. In such a case, you are advised to bring your personal computer with software installation and software dongles along with you.