X-ray analytical instrumentation from Rigaku for coating thickness and composition is featured at Labelexpo Americas 2018
September 25, 2018 – Rosemont, IL. Applied Rigaku Technologies, Inc. (ART), a division of Rigaku Corporation, is presenting its Energy Dispersive X-ray Fluorescence (EDXRF) elemental analysis instrumentation at Labelexpo Americas 2018, held September 25 - 27, 2018 at the Donald E. Stephens Convention Center in Rosemont IL, USA. ART is presenting its analytical solutions at booth 2046.
EDXRF is a standard technique across the paper and film industry for determining silicone coating thickness & composition, as well as other important paper chemistries. Featured instrumentation from ART includes the Rigaku NEX QC series of benchtop EDXRF spectrometers and the new Rigaku NEX LS linear scanner for cross and down web profiling.
Paper and plastic are often coated with a thin layer of silicone as a release coating when manufacturing liners for labels or tapes. During the coating process the amount of silicone coating applied must be periodically measured in order to ensure that the proper physical properties of the product are maintained. When coating is too heavy, silicone material is needlessly wasted, while too little coating may result in product rejection.
The NEX QC series EDXRF analysers from Rigaku offers rapid quantitative analysis for silicone coated paper and films, delivering precise analysis without the need for helium or special sample holders. The sample is simply placed over the aperture, or multiple samples in a sample, tray and measured. The technique gives the QC technician an ideal tool for quickly checking silicone coat weight in order to maintain the highest product quality with minimal costs.
On display at the event will be the Rigaku NEX QC+ spectrometer. It is designed for more demanding applications such as clay coated papers, or for situations where analysis time or sample throughput is critical. Employing the next generation silicon detector technology, the enhanced NEX QC+ analyser provides rapid determination of Si coat weights on all substrates while maintaining exceptional repeatability and long-term reproducibility.
Also presented at the event is the new Rigaku NEX LS linear scanner for cross and down web profiling of webs and coils. Featuring advanced third generation EDXRF technology, the Rigaku NEX LS analyzer represents the next evolution of scanning Si coat weight analyzers, delivering rapid, non-destructive, analyses for Si coatings on-line.
The new instrument is a scanning system comprised of an EDXRF measurement head mounted to a linear drive, which transports the head back and forth across a moving web (or coil) while transmitting the real time cross-machine direction measurements to a local industrial touch screen computer and plant control system. Data are presented in real time as cross and down web graphical profiles on the user interface and saved for reporting purposes.
Equipped with a 50 kV X-ray tube and Fast® SDD detector, the Rigaku NEX LS analyzer is engineered to service a broad range of process control coating applications.
More information about EDXRF solutions from Applied Rigaku Technologies, Inc. for coating thickness and composition analysis is available at www.rigakuedxrf.com/paper.php
For further information, contact:
Robert P. Bartek
President
Applied Rigaku Technologies
(+1) 512-225-1796
info@RigakuEDXRF.com