SESSION 1 Dr. Kiyoshi Ogata Senior Executive Vice President | General Manager and X-ray Instruments Division and Semiconductor Metrology Division Rigaku Corporation Welcome from Rigaku
SESSION 1 Boris Metodiev Associate Director TechInsights European Semi Outlook – Challenges and Opportunities
SESSION 2 Laith Altimime President SEMI Europe Europe Semiconductor Ecosystem in a $1T Era by 2030
SESSION 2 Dr. Jean Fompeyrine Co-founder Lumiphase Corporation Integrated photonics with Pockels materials
SESSION 3 Dr. Paul Van Der Heide Director of Materials and Component Analysis (MCA) IMEC Metrology and Expectations of tomorrows IC Industry
SESSION 3 Dr. Kiyoshi Ogata Senior Executive Vice President | General Manager and X-ray Instruments Division and Semiconductor Metrology Division Rigaku Corporation X-ray Metrology Opportunities and Challenges for Advanced Semiconductor Technologies
SESSION 4 Dr. Andrea Severino Technical Team Manager ST Microelectronics Controlling Properties of Wide Bandgap Materials in Industry
SESSION 4 Dr. Abner Bello Manager, Specialty Measurements Corning Incorporated Metrology from Lab to Fab
SESSION 5 Dr. Alessandra Alberti Senior Researcher National Research Council (CNR) Third-generation photovoltaics based on perovskites
SESSION 5 Dr. Ing. Christian Reimann Group Manager Silicon and Special Materials Fraunhofer Crystallographic defect characterization of semiconductor single crystalline materials by X-ray topography
SESSION 6 Dr. David Rogers Co-founder Nanovation An Introduction to Nanovation and how we use XRD for Characterization and Quality Control of Oxide Semiconductors
