Element / phase analysis and molecular structure
X-ray analytical methods have a long history as important tools to investigate and establish facts in criminal or civil courts of law to analyze, identify or compare unknown materials. Small spot X-ray fluorescence (XRF) is a non-destructive method to determine concentration and distribution of chemical elements such as Pb and Cu residue from bullet holes in clothing, for example. X-ray diffraction (XRD) can identify chemical phases in complete unknowns. Both techniques allow standardless quantification of element concentrations and phase composition. Rigaku's Raman spectrometer Progeny ResQ 1064 nm provides the industry’s most comprehensive tool for fast and reliable chemical identification, CBRNe detection and narcotics classification in a simple and easy-to-use handheld form.
Application Notes
The following application notes are relevant to this industryXRD
Raman
EDXRF
Total reflection XRF (TXRF)
Rigaku recommends the following systems:
WDXRF
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
XRD
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Raman
The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics
Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage
EDXRF
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
