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Forensics and conservation


Element / phase analysis and molecular structure

X-ray analytical methods have a long history as important tools to investigate and establish facts in criminal or civil courts of law to analyze, identify or compare unknown materials. Small spot X-ray fluorescence (XRF) is a non-destructive method to determine concentration and distribution of chemical elements such as Pb and Cu residue from bullet holes in clothing, for example. X-ray diffraction (XRD) can identify chemical phases in complete unknowns. Both techniques allow standardless quantification of element concentrations and phase composition. Rigaku's Raman spectrometer Progeny ResQ 1064 nm provides the industry’s most comprehensive tool for fast and reliable chemical identification, CBRNe detection and narcotics classification in a simple and easy-to-use handheld form.

Rigaku recommends the following systems:


Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

Tube below, single element WDXRF analyzer for quality control applications


New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification


 The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics

Narcotics-focused analyzer to identify the latest opioid and fentanyl formulations

Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage


60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films


Foreign object X-ray inspection instrument

200 kV microcomputerized directional industrial X-ray system

Foreign object X-ray inspection instrument

Foreign object X-ray inspection instrument

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples