Element / phase analysis and molecular structure
Characterization and compositional analysis of substances like metals, ceramics or plastics that are part of any application—including space science, defense technology or any other kind of technology or product—are key in material science. X-ray technology can investigate elemental composition and layer thickness by X-ray Fluorescence (XRF) in semiconductors or other new materials. X-ray Diffraction and Scattering are primary techniques to study crystalline phases, their degree of crystallinity or crystallographic structure and orientation, texture or residual stress. XRT (X-ray topography) investigates crystalline defects in advanced materials like semiconductors, and X-ray reflectometry (XRR) measures layer thicknesses, roughness and interlayer diffusion. Associated diffuse scattering methods like SAXS examine the nature of the molecular structure of films, coatings and layers or particles in disciplines like biology, chemistry, physics, and engineering. Rigaku advanced technology and experience provide a variety of non-destructive, state-of-the-art analytical solutions and services for your materials.
Small Molecule, Single crystal
Protein, Single crystal
X-ray CT, Computed tomography
Single crystal, XRD
Total reflection XRF (TXRF)
Our most popular diffractometer for Chemical Crystallography and Mineralogy, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
A benchtop single crystal X-ray diffractometer ideal for chemical crystallography and teaching.
An entry-level single crystal X-ray diffractometer for Chemical Crystallography configured with microfocus sealed tube technology and a direct X-ray detection detector.
Our most popular diffractometer for Protein Crystallography, configured with a high-flux rotating anode X-ray source and an extremely low noise direct X-ray detection detector.
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
User-inspired data collection and data processing software for small molecule and protein crystallography.
The smallest detachable motorized goniometer head on the market.
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
WDXRF spectrometer designed to handle very large and/or heavy samples
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
High-resolution benchtop microtomography of large samples
X-ray topography (XRT)
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Extremely low noise, compact, detector based on direct X-ray detection technology.
A modernized 2D Kratky system that eliminates data corrections required of traditional systems