Elemental, phase and residual stress analysis
Quality production demands control of material properties throughout the entire process from raw material to finished product. The speed and precision of X-ray fluorescence (XRF) elemental analysis make it a preferred testing method in high sample throughput chemical analysis. In addition to alloy stoichiometry, X-ray diffraction (XRD) examines phase composition, retained austenite concentration or residual stress, which correlate with structural quality of your products.
Application NotesThe following application notes are relevant to this industry
A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analysis of a platinum nanoparticulate film
Evaluation of the effects of shot-peening treatment on the surface of a spring by X-ray stress measurement
Rigaku recommends the following systems:
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
High-resolution benchtop microtomography of large samples
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
The world’s smallest portable stress analyzer that is specifically designed for field analysis
Compact 2D X-ray camera with micron and sub-micron resolution for imaging