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Polymers, plastics and rubber

Polymers, plastics and rubber

Element & phase analysis, particle sizes and molecular structure

For all tasks in polymer research, development and production quality control, X-ray Fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) such as antimony, barium, bromine, calcium, chromium (in accordance with RoHS/WEEE regulations), copper, phosphorus, titanium or zinc. In addition, many plastic polymers have some degree of order that can be identified and studied by X-ray Diffraction (XRD) methods. The percent crystallinity—measured with XRD—can correlate to processing methods. The determination of unit cell type, lattice parameters, microstructure and crystallographic orientation through pole figures can be of importance. Periodic or crystalline structures on the nanoscale can be examined by Small Angle X-ray Scattering (SAXS) and Wide Angle X-ray Scattering (WAXS). Rigaku offers comprehensive Instruments and services for all methods.   

Application Notes

The following application notes are relevant to this industry

EDXRF

X-ray Imaging

EGA, Thermal Analysis

XRD

Process

Thermal Analysis

WDXRF

SAXS

EGA

X-ray CT, Computed tomography

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

EDXRF

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films

SAXS

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

Thermal Analysis

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).