Elemental, phase and residual stress analysis
Foundries, smelters and mills, as well as other aspects of the metals industry, are characterized by having continuous production demanding day and night control of both the process and the quality of incoming and outgoing materials. X-ray fluorescence (XRF) analysis plays a dominant role in controlling the production processes within these industries. The speed and precision of XRF make it a preferred testing method where high throughput chemical analysis is required to support the production process. In addition to alloy stoichiometry, another important characteristic of metals is residual stress which is correlated with structural failure. X-ray diffraction (XRD) is the only accurate way to measure residual stress non-destructively. XRD offers non-contact measurements with unsurpassed spatial resolution and the ability to measure phases in metals.
Handheld Metal Alloy Analysis
Within seconds, the Rigaku KT-100S handheld metal analyzer easily performs identification of the most difficult alloy grades. The KT-100S analyzer utilizes laser induced breakdown spectroscopy (LIBS) enabling durable and accurate alloy identification for use in scrap metal sorting, quality assurance in metal fabrication, and positive material identification (PMI) in mission-critical operations, such as aerospace and petrochemical.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
High-resolution benchtop microtomography of large samples
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
The world’s smallest portable stress analyzer that is specifically designed for field analysis
Compact 2D X-ray camera with micron and sub-micron resolution for imaging