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Mining and refining

Mining and refining

Analysis of ores, feeds, slag, tails and metals

Rigaku instruments are used for elemental and mineralogical analysis for efficient, green and high-quality production. X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) can be used to determine, for example, metal-oxide concentrations, oxide stoichiometry and quantities of mineralogical phases, which are crucial for your mining, refining and production processes. Rigaku offers a variety of solutions for your R&D laboratory, for routine production and process control, as well as cost-effective benchtop equipment, fulfilling the analytical requirements of industry standards. All of this is combined with excellent service and support structure for guaranteed equipment uptime.

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

EDXRF

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

Applications

The following applications are relevant to this industry

WDXRF

EDXRF

XRD