Low temperature diffraction

Study dynamic processes that need to be investigated in situ

Low temperature diffractionX-ray diffraction (XRD) at non-ambient conditions can be used for a variety of applications, including the study of dynamic processes that need to be investigated in situ. Examples of such processes are the reactions involving the solid state, phase transitions, crystallite growth, thermal expansion, etc. X-ray diffraction can be used as a very informative complement to other, more traditional, thermal analytical techniques (thermogravimetry, differential scanning calorimetry, etc.), thus effectively providing phase identification, texture analysis, and crystallite size measurement.

Systems

RAPID II   RAPID II
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
  Ultima IV   Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
  SmartLab   SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software