Particle size and shape

XRD for nanomaterials

Particle size and shapePhysical and chemical properties of nanoparticles and nano crystalline materials are strongly influenced by their particle size, shape and structural strain, including rheology, surface area, cation exchange capacity, solubility, reflectivity, etc. Crystallite size is performed by measuring the broadening of a particular X-ray diffraction (XRD) peak in a diffraction pattern associated with a particular planar reflection from within the crystal unit cell. It is inversely related to the FWHM (full width at half maximum) of an individual peak: the more narrow the peak, the larger the crystallite size. This is due to the periodicity of the individual crystallite domains, in phase, reinforcing the diffraction of the X-ray beam, resulting in a tall narrow peak. If the crystals are defect free and periodically arranged, the X-ray beam is diffracted to the same angle even through multiple layers of the specimen. If the crystals are randomly arranged, or have low degrees of periodicity, the result is a broader peak.

Systems

TTRAX III   TTRAX III
World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm
  Ultima IV   Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
  SmartLab   SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
NANOPIX   NANOPIX
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
  NANOPIX mini  

NANOPIX mini
The world’s first benchtop small angle X-ray scattering (SAXS) system

  NanoMAX   NanoMAX
A modernized 2D Kratky system that eliminates data corrections required of traditional systems