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Summer 2016, Volume 32, No. 2


Summer 2016, Volume 32, No. 2

Liquid analysis by total reflection X-ray fluorescence spectrometer

Kazuaki Okuda

Total Reflection X-ray Fluorescence (TXRF) is a method that can be used for high sensitive elemental analysis on solid sample surface, and has been widely used for detecting contamination on wafer to improve fabrication process yield in the semiconductor industry. On the other hand, there has been increasing need for...

Sample preparation for X-ray fluorescence analysis VI. Metal samples

Takao Moriyama and Eiichi Furusawa

Sample preparation methods for X-ray fluorescence analysis (XRF) featuring powder samples were discussed in the previous issues. Preparation of metal samples is introduced in this issue. XRF is superior to ICP and optical emission spectroscopy in reproducibility. However most of analysis errors in XRF can be caused by nature of...

Nanoscale X-ray structural characterization instrument: NANOPIX

SAXS (Small Angle X-ray Scattering) is a powerful tool for nano-scale structural analysis covering a broad range of applications from research and development to quality control. The technique targets a broad range of materials, from periodic and non-periodic structures including solid, liquid, liquid crystal and gels to research in advanced...

X-ray diffractometer system with single or dual PhotonJet microfocus sources

With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy produces fast, precise data in an intelligent fashion.

CrysAlis(Pro) Single crystal diffraction software

Rigaku Oxford Diffraction single’s crystal diffraction systems are controlled with the user-inspired CrysAlisPro software. CrysAlisPro integrates and interfaces seamlessly with not only our own equipment but also with third party data collected on other diffraction systems. It delivers precise system control and superior X-ray data quality and analysis.

Introduction to X-ray analysis using the diffraction method

Hideo Toraya

A scientific discipline, which investigates crystal structures by means of the X-ray diffraction method, is called X-ray crystallography or simply crystallography. It originated in a discovery of the phenomena that X-rays are diffracted by crystals, and it has a history of more than one hundred years. Various analytical techniques based...