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Summer 2017, Volume 33, No. 2

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Summer 2017, Volume 33, No. 2

Crystal structure analysis from powder X-ray diffraction data using high-temperature attachment for capillaries

Hisashi Konaka and Akito Sasaki

The physical and chemical properties of a crystalline solid depend heavily on the conformations of the molecules and the arrangement of atoms and molecules, that is, the “crystal structure”, as well as on the composing elements and molecular structures. The single crystal structure analysis technique is used in many fields as a good tool to precisely...

Investigation for fuel-cell structures with multi-scale X-ray analysis

Kazuhiko Omote, Tomoyuki Iwata, Yoshihiro Takeda and Joseph D. Ferrara

It is well known that X-rays have wavelengths comparable with interatomic distances and can be utilized for atomic-scale structural determination. In addition, X-rays can penetrate through opaque objects and show the internal structure without destroying the object. It is for these reasons that X-rays are widely used for atomic-scale structural analysis of various kinds of crystals including...

Introduction to single crystal X-ray analysis XII. Tips for collection and processing of protein crystal data

Takashi Matsumoto

Single crystal X-ray analysis of proteins involves many hurdles to be overcome, including protein expression, crystallization, data collection and phase determination. Advanced radiation facilities, innovative detector systems, laboratory systems with high-intensity X-ray sources and newly developed software have drastically expanded the range of crystals that can be analyzed. Despite such improvements, there are still some hurdles to be...

Thickness and composition analysis of thin film samples using FP method by XRF analysis

Hikari Takahara

X-ray fluorescence spectroscopy (XRF) is an elemental quantification analysis method for inorganic and metallic compounds. Sample preparation is simple and does not require solid samples to be dissolved, as is necessary for wet chemical analysis techniques. The fundamental parameter (FP) method implements quantitative analysis without type standards. The XRF technique has been widely accepted not only for...

How to measure trace amounts of sample by X-ray fluorescence analysis

Satoshi Ikeda

Figure 1 shows typical sample preparation methods for X-ray fluorescence analysis. In general, the shadowed methods are the most popular. Quality control analysis, which requires high precision, normally requires large samples as much as 20 mm–30 mm in diameter. However, in many cases it is difficult to prepare samples large enough or in sufficient quantity for R&D...

Automated multipurpose X-ray diffractometer - SmartLab SE

SmartLab SE, which includes a semiconductor detector as a “standard” component, is Rigaku’s newest automated multipurpose X-ray diffractometer system. Customers can select either the “2D” or the “1D” version of this system. If customers select the “2D” model, they can easily determine the degree of preferred orientation and coarse grain size effects from the shape of Debye-Scherrer...

Integrated X-ray diffraction software -- SmartLab Studio II

SmartLab Studio II is an integrated X-ray diffraction software package for making both measurements and analyses using SmartLab, an automated multipurpose X-ray diffractometer. Two years ago(1), the user guidance feature, flow bars, chart control, report manager, SQL database*1, and plugin modules were introduced. Now we would like to announce several new features of SmartLab Studio II for...