SmartLab SE, which includes a semiconductor detector as a “standard” component, is Rigaku’s newest automated multipurpose X-ray diffractometer system. Customers can select either the “2D” or the “1D” version of this system. If customers select the “2D” model, they can easily determine the degree of preferred orientation and coarse grain size effects from the shape of Debye-Scherrer rings using the hybrid pixel array detector “HyPix-400”. The SmartLab SE configured with a HyPix-400 detector operates in 0, 1, and 2D models without the need to change the detector.
This system also offers the original ease-of-use features of the SmartLab system: automatic alignment, component recognition, and Cross Beam Optics. The guidance software recognizes installed components and seamlessly integrates them into data collection and data analysis methods. The Cross Beam Optics (CBO) module offers permanently mounted, automatically aligned and user-selectable optical geometries for various diffraction experiments. For example, one can choose a Bragg-Brentano optics and parallel beam optics combination for measurements of both powders and thin films without the need for instrument reconfiguration. One can also choose a Bragg-Brentano optics and focusing transmission optics combination to measure organic materials in both transmission and reflection modes.