Hikari Takahara and Hironori Kobayashi
Standardless FP X-ray fluorescence analysis is a quantification method using theoretical calculations including fundamental parameters. The analysis method has been widely used in the electronics and petrochemical industries, among others, since it can simply and quickly quantify sample compositions from spectral peak intensities without preparing calibration curves. In this report, the standardless FP analysis method was tested for metallic oxide compounds using cement and geological reference materials. The analysis results for Ni-based and Ni, Co, Mn-based cathode materials and SiO anode materials are shown.