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X-ray thin-film measurement techniques VIII. Detectors and series summary

Winter 2012, Volume 28, No. 1
08-13
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Shintaro Kobayashi and Katsuhiko Inaba

The various XRD techniques as the characterization tools for thin film samples have been presented in this series of “X-ray thin-film measurement technique” lecture course. There has heretofore been remarkable progress with detectors equipped with XRD apparatus.  In this lecture, some explanation of the features and functions of 1-dimensional (1D)/2-dimensional (2D) detectors should be presented before summarizing this technical lecture course.

 

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