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Winter 2014, Volume 30, No. 1

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Winter 2014, Volume 30, No. 1

General features of GaN-related materials

Katsuhiko Inaba

In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment impact and with higher efficiency of energy conversion to ensure a sustainable society. GaN (gallium nitride) and related materials have been a focus of attention...

Characterization of GaN-related materials using high-resolution XRD

Katsuhiko Inaba

Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required due to the complexities resulting from peculiar features in GaN-related materials, as explained in the preceding article.

General explanation for the application of HR-XRD techniques to the characterization of semiconductor...

Visualization and analysis of pharmaceutical solids by X-ray microscopy

Yoshihiro Takeda and Kensaku Hamada

A current trend in drug delivery systems is the use of multicoated or orodispersible tablets. These new systems increase bioavailability and can improve patient compliance by removing the need to swallow. The functionality of these structured tablets is sensitive to fluctuations in the manufacturing process. The chemical formulation is important...

Sample preparation for X-ray fluorescence analysis

Yasujiro Yamada

XRF (X-ray fluorescence) analysis as a technique is widely used in academia, research and development and industry as an analysis tool for the determination of elemental composition of materials. Unlike wet chemical and other instrumental techniques which require the use of hazardous chemicals and difficult preparation methods to dissolve samples...

High-throughput, high-resolution X-ray topography imaging system: XRTmicron

The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new high-brilliance microfocus X-ray source, together with an X-ray mirror optical system and high-sensitivity/high-resolution X-ray camera designed for that source. Furthermore, it can automatically perform tasks...

High-speed 1D silicon strip X-ray detector D/teX Ultra 250

In X-ray diffractometry, a variety of detectors are used depending on the purpose of the measurement. In recent years, in addition to the previously used 0D detectors (scintillation counters etc.), there has been increasing use of 1D detectors in which multiple detector elements are packaged into a single unit using...

Plate adapter for in situ X-ray diffraction experiments: PlateMate

The Rigaku PlateMate is a tool that allows one to mount SBS format crystallization plates on Rigaku goniometers for in situ diffraction experiments. Protein crystallography often requires screening large numbers of crystals to identify samples suitable for X-ray data collection. Traditionally, crystallographers mounted crystalline samples in capillaries — a time...