Rapid data acquisition with the world’s smallest stress analyzer
X-ray stress measurement permits the non-destructive measurement of residual stress, primarily in the surfaces of metallic components or structures, and is a common measurement method for material strength, lifetime prediction and other estimations in the industrial field.
However, applications have been limited as measurement objects are often structures that cannot be brought into a laboratory, or large parts that cannot be measured due to work space limitations.
SmartSite RS can be brought to the measurement site and has made stress measurement possible even in cases as those described above. In addition, quantification of retained austenite can be performed with an optional attachment. The device is powered either by plugging into a 100–240 VAC socket or by battery, enabling measurements at various locations. Transport, even to remote sites, is easy as the entire system readily fits into the included carrying case.