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Use of multi-dimensional measurement in powder X-ray diffraction

Winter 2018, Volume 34, No. 1
09-13
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Yukiko Namatame, Takahiro Kuzumaki, Yuji Shiramata and Keigo Nagao

In powder X-ray diffraction (XRD) measurements, the measurement mode (0D, 1D, 2D) and optical system are selected to suit the state of the sample and the purpose of the experiment. Until about 10 years ago, the typical approach was a 0D measurement using a scintillation counter (SC) combined with the Bragg-Brentano focusing method (BB optical system) or the parallel beam method. However, due to the development of semiconductor detectors, it became possible to also select 1D and 2D measurement, and the number of optical systems that can be used in combination is increasing every year. This paper presents examples where it is effective to change the measurement mode (0D, 1D, 2D) or optical system when the sample contains trace components, or when particle size or orientation have an effect on the sample. Table 1 summarizes the sample conditions and system configurations explained in this paper. The latest SmartLab SE powder X-ray diffractometer was used for most measurements.

 

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