SmartLab Studio II Data Visualization plugin —Analysis examples of micro area XY mapping using CBO-μ—

XY mapping measurements to obtain physical values for your analysis purpose is one of the best ways to analyze the state distribution of a substance, the strength distribution of a material or a device, etc. The significant progress in X-ray sources, optical devices and detectors has enabled the irradiated area to be narrowed and low X-ray intensities to be detected. It is becoming possible to evaluate smaller (or smaller areas of) materials without high-cost optical devices or attachments. This article describes the following experiments and analysis:

• The sample was moved in the X and Y directions step by step using an XY attachment;
• The X-ray beam was conditioned by an optical device called CBO-μ and irradiated onto a small area;
• The X-rays diffracted from the sample were collected using the HyPix-3000 2D hybrid pixel array detector;
• The collected data sets were analyzed using the Data Visualization plugin of the integrated X-ray analysis software SmartLab Studio II.