
Rigaku nano3DX is a true computed tomography (CT) X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, parallel beam geometry for rapid data collection.
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ZSX Primus IV High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software |
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ZSX Primus II High power, tube above, sequential WDXRF spectrometer with mapping and superior light element performance |
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Supermini200 Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders |
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Simultix 15 High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U |
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RAPID II Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources |
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Ultima IV High-performance, multi-purpose XRD system for applications ranging from R&D to quality control |
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MiniFlex New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification |
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In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employ a small analyzing area and a XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.