
HyPix-3000 is a next-generation two-dimensional semiconductor hybrid pixel array detector (HPAD), pixel size of 100 um², designed specifically to meet the needs of the home lab diffractionist.
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ZSX Primus IV High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software |
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NEX QC Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films |
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NEX CG High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films |
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ZSX Primus IV High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software |
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Supermini200 Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders |
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NEX CG High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films |
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MiniFlex New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification |
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Ultima IV High-performance, multi-purpose XRD system for applications ranging from R&D to quality control |
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NEX DE VS New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software. |
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RAPID II Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources |
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SmartLab Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software |
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NEX QC+ QuantEZ NEX QC+ with powerful Windows® software and optional FP. |
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NANOPIX Small and wide angle X-ray scattering instrument designed for nano-structure analyses |
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NANOPIX mini |
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NanoMAX A modernized 2D Kratky system that eliminates data corrections required of traditional systems |
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Governments and industry collectively invest billions of dollars every year into the research and development of advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from space science and defense technology to consumer products. X-ray diffraction (XRD) is a primary technique for the study advanced materials, including investigation of the following properties: identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, pore sizes, as well as much more. The influence of non-ambient conditions on these properties is also routinely studied with the XRD technique. Investigations may be carried out on samples of varying types, from powders, to solid materials of varying shapes and size, to solutions and semiconductor wafers. Rigaku technology and expertise provide a number of unique solutions for materials science applications.