Skip to main content

Rigaku Features Latest X-ray Analytical Instrumentation at 2019 Denver X-ray Conference

Rigaku is showcasing its XRD and XRF spectrometers at the joint meeting of the 68th Annual Conference on Applications of X-ray Analysis (DXC) and the 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25)

August 6, 2019 –Lombard, IL. Rigaku Corporation, a global leader in X-ray analytical instrumentation, is pleased to announce its attendance at the 68th annual Denver X-ray Conference (DXC 2019), being held as a joint meeting with the 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25) at the Westin Lombard Yorktown Center, Lombard, Illinois, U.S.A. the week of 5 – 9 August 2019.

Rigaku is exhibiting its diverse range of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation in the South Foyer at Booth numbers 25, 26, and 27. X-ray and EUV multilayer optics from Rigaku Innovative Technologies (RIT) are featured at Booth 28.

Rigaku manufactures a complete range of XRD and XRF instruments and components for research, testing, industrial process control, and product development.


Systems on display at the event include the Rigaku Supermini200 wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. With enhanced software capabilities and an improved footprint, it is the only commercially available high-power (200 W) benchtop sequential WDXRF spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material. It uniquely delivers low cost-of-ownership with high resolution and lower limits of detection (LLD).


The sixth generation Rigaku MiniFlex benchtop X-ray diffraction instrument is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The latest MiniFlex system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer. The direct photon counting detector enables high speed, low noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation.


Also featured is the Rigaku SmartLab intelligent X-ray diffraction system. The SmartLab ® system is a multi-purpose, high-resolution diffractometer designed for all XRD applications, from powder and thin film diffraction to small angle X-ray scattering (SAXS) and in-plane scattering. The system’s Guidance software provides an intelligent interface that guides users through each experiment.

Workshops and poster sessions presented by Rigaku staff will take place throughout the conference and will include presentations covering topics such as X-ray Computed Tomography, Sample Preparation and Experimental Conditions, Quantitative Analysis and Trace Analysis.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1. 512-225-1796
michael.nelson@rigaku.com