TXRF series
Rigaku's TXRF series excels in semiconductor manufacturing and R&D, detecting surface contamination with high sensitivity to trace elements. Integrated Vapor-Phase Decomposition (VPD) ensures low detection limits for precise quantitative analysis of thin films, enhancing quality control.
Learn more >
WDXRF series
WDXRF series, renowned for precise measurement of material thickness and composition, especially with light elements, are vital in semiconductor manufacturing and R&D for ensuring high-performance device creation. Rigaku solutions include AZX 400 and WaferX 310.
Learn more >
Hybrid metrology tools
XRR, EDXRF, XRD, and optical techniques typically for characterizing multilayer samples for BEOL and packaging applications, as well as the characterization of ultrathin, multilayer samples, unpatterned and/or patterned wafers.
Learn more >
X-ray diffraction
Three-dimensional atomic structures of small molecules and proteins may be unambiguously determined by single crystal X-ray diffraction.
Learn more >.jpg?width=800&name=XtaLAB%20Synergy-ED%20(1200).jpg)
Electron diffraction
Electron diffraction provides researchers with the ability to perform single crystal diffraction on samples smaller than those at the limit of X-ray diffraction.
Learn more >
Reagents
Crystallization reagents and stock solutions are available in convenient screens and as custom products.
Learn more >
X-ray diffraction (XRD)
XRD is commonly used to identify and refine powder and polycrystalline materials. You can also quantify crystalline phases or study polycrystalline and epitaxial thin film structures, crystalline quality, and preferred orientation.
Learn more >
Small-angle X-ray scattering (SAXS)
SAXS is sensitive to the size, shape, and arrangement of nanoscale structures within the material and is widely used to study nanomaterials and protein
Learn more >
Stress analysis
X-ray residual stress analysis is one of the few nondestructive techniques to measure stress in solid materials. It is widely used in the automobile industry.
Learn more >
Wavelength dispersive XRF (WDXRF)
Wavelength dispersive X-ray fluorescence (WDXRF) is a technique that has become indispensable when fast, accurate elemental analysis is needed.
Learn more >
Energy dispersive XRF (EDXRF)
Energy dispersive X-ray fluorescence (EDXRF) spectroscopy provides one of the simplest, most accurate and most economic analytical methods for the determination of the chemical composition of many types of materials.
Learn more >
Total Reflection XRF (TXRF)
Total reflection X-ray fluorescence spectroscopy (TXRF) is a powerful analytical technique used for the elemental analysis of samples with very low concentrations of trace elements.
Learn more >
X-ray computed tomography (CT)
X-ray CT can analyze the internal structures of materials and objects non-destructively at micron to submicron resolution. Rigaku's CT scanners are easy to use and widely implemented in research facilities and failure analysis laboratories.
Learn more >
Molecular imaging
MILabs - a Rigaku company - offers versatile preclinical small animal imaging platforms in the field. You can combine multiple modalities, including PET, SPECT, Optical 2D, 3D or 4D CT. These modalities are upgradable to scale your preclinical research.
Learn more >
DSC
DSC is a technique that measures the change in thermal energy generated within a sample when the sample is heated or cooled according to a certain temperature program. DSC is an analytical instrument that is often used to investigate reaction temperatures and reaction energy amounts such as melting, crystallization, crystal transition, and glass transition.
Learn more >
STA
STA is an instrument that simultaneously performs TG and DSC measurements. When a sample is heated according to a specified temperature program, TG detects mass changes associated with heating or cooling, while DSC measures heat flow (thermal energy) caused by endothermic or exothermic reactions and phase transitions such as melting or glass transitions.
Learn more >
TMA
TMA is a technique for measuring the change in shape of a sample when it is heated or cooled according to a temperature program while applying a non-oscillating load such as compression, tension, or bending to the sample.
Learn more >
CQL Max-ID
Maximizes chemical threat analysis, with the largest on-board library to identify over 13,000 items including narcotics, explosives, toxic chemical industrial chemicals, chemical warfare agents (CWAs), and more.
Is the CQL Max-ID right for me? >
CQL Narc-ID
Presumptive identification of narcotics, precursor chemicals, and cutting agents.
Is the CQL Narc-ID right for me? >
Progeny
Versatile, handheld spectrometer for raw material identification and verification.
Is Progeny right for me? >
X-ray sources
Rigaku produces microfocus rotating anode and sealed tube X-ray sources for various analytical techniques, including X-ray diffraction, X-ray fluorescence, and small-angle X-ray scattering.
Learn more >
EUV and X-ray optics
Rigaku offers a range of optics designed to focus X-ray beams and other radiation sources for optimal performance in analytical instruments.
Learn more >
X-ray detectors
Rigaku manufactures high-resolution X-ray detectors, including semiconductor-based detectors, such as silicon drift detectors or silicon strip detectors, gas-filled proportional counters, and scintillation detectors.
Learn more >
Process control
EDXRF technology is used for process elemental analysis for liquid stream and fixed position web or coil applications. X-ray transmission technology is used for sulfur measurement of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons.
Learn more >
Contact Us
Whether you're interested in getting a quote, want a demo, need technical support, or simply have a question, we're here to help.