- Fully integrated electron diffractometer creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures.
- Improve your ability to investigate nanocrystalline samples due to the ability of electron diffraction to measure crystals that are only a few hundred nanometers or less in size.
- No Sharing of instrument with microscopists because switching a microscope configuration between imaging and diffraction can be time consuming, making the sharing of an instrument sometimes difficult.
- Any X-ray crystallographer will find intuitive to operate without having to become an expert in microscopy.
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Fully Integrated Electron Diffractometer
A system any X-ray crystallographer will find intuitive to operate
Product name | XtaLAB Synergy-ED |
Technique | Single crystal electron diffraction |
Core attributes | Dedicated electron diffractometer with hybrid pixel array detector, rotation axis, and CrysAlisPro-ED, a complete integrated software platform. |
Detector | High-speed, high-sensitivity hybrid pixel array detector, HyPix-ED |
Source | Acceleration up to 200 kV |
Goniometer | Single rotation axis |
Accessories | Various low temperature devices |
Computer | External PC, MS Windows® OS |