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- Fully integrated electron diffractometer creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures.
- Improve your ability to investigate nanocrystalline samples due to the ability of electron diffraction to measure crystals that are only a few hundred nanometers or less in size.
- No Sharing of instrument with microscopists because switching a microscope configuration between imaging and diffraction can be time consuming, making the sharing of an instrument sometimes difficult.
- Any X-ray crystallographer will find intuitive to operate without having to become an expert in microscopy.
Fully Integrated Electron Diffractometer
A system any X-ray crystallographer will find intuitive to operate
XtaLAB Synergy-ED is a new and fully integrated electron diffractometer, creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures. The XtaLAB Synergy-ED is the result of an innovative collaboration to synergistically combine our core technologies: Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED) and state-of-the-art instrument control and single crystal analysis software platform (CrysAlisPro for ED), and JEOL’s long-term expertise and market leadership in designing and producing transmission electron microscopes. The key feature of this product is that it provides researchers an integrated platform enabling easy access to electron crystallography. The XtaLAB Synergy-ED is a system any X-ray crystallographer will find intuitive to operate without having to become an expert in electron microscopy.
The XtaLAB Synergy-ED was designed to address the increasing need to investigate smaller and smaller samples in structural research. With X-ray crystallography, the smallest possible crystal dimension is 1 micron, and only then when utilizing the brightest X-ray sources and noise free detectors. However, in recent years, there has been an increasing need for the structure analysis of substances that only form microcrystals, crystals that are only a few hundred nanometers or less in size. In recent years, a new analytical method, MicroED, has been developed that uses electron diffraction on a TEM electron microscope to measure 3D molecular structures from nanocrystalline materials. Researchers developing this technique have relied on customized electron microscopes and a combination of microscopy software for measuring diffraction data, and public domain X-ray crystallography software for data processing and structure determination. Switching a microscope configuration between imaging and diffraction can be time-consuming, making the sharing of an instrument sometimes difficult.
To address these issues, Rigaku and JEOL started a collaboration to develop a dedicated single crystal structure analysis platform for nanocrystals utilizing key technologies from both companies. The result is the XtaLAB Synergy-ED, a dedicated electron diffractometer that is operated by the same control software that is used to run Rigaku’s X-ray diffractometers and includes a complete integrated pipeline from sample selection and diffraction measurement to data processing and structure solution. This instrument can easily be installed in an existing X-ray crystallography facility, where researchers and students will be able to easily master the MicroED technique since the software workflow is the same as for an X-ray diffractometer. Having such an instrument installed in an X-ray facility immediately provides structure determination for materials that only form nanocrystals.
|Product name||XtaLAB Synergy-ED|
|Technique||Single crystal electron diffraction|
|Core attributes||Dedicated electron diffractometer with hybrid pixel array detector, rotation axis, and CrysAlisPro-ED, a complete integrated software platform.|
|Detector||High-speed, high-sensitivity hybrid pixel array detector, HyPix-ED|
|Source||Acceleration up to 200 kV|
|Goniometer||Single rotation axis|
|Accessories||Various low temperature devices|
|Computer||External PC, MS Windows® OS|
Application NotesThe following application notes are relevant to this product
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