NEX OL
Features
- Real-time process control by elemental analysis
- Measure elements aluminum (₁₃Al) to uranium (₉₂U)
- From ppm levels to weight percent (wt%) concentrations
- Robust Rigaku NEX QC+ optical kernel with SDD detector
- Industrial touch screen user interface
- Easy empirical calibration and routine operation
- Routine maintenance typically requires no tools
- Multiple remote analysis heads for non-classifi ed areas
- No dangerous radioisotopes
Process energy dispersive X-ray fluorescence analyzer
Real-time, on-line process elemental analysis
Specifications
Product name | NEX OL |
Technique | X-ray fluorescence (XRF) |
Benefit | Real time, on-line elemental analysis of Al through U |
Technology | Process energy dispersive XRF |
Core attributes | 50 kV, 4 W X-ray tube, SDD detector, tool-less flow cell design (liquids), fixed head for coating thickness and composition |
Core options | Varies by configuration |
Computer | Internal PC, embedded Linux OS, NEX OL software |
Core dimensions | Varies by configuration |
Mass | Varies by configuration |
Power requirements | 1Ø, 110/240 VAC, 2.5/1.5 A, 47-63 Hz |