ZSX Primus IVđť’ľ
Tube-Below Sequential Wavelength Dispersive X-ray Fluorescence Spectrometer
Uncompromised X-ray analysis of liquids, alloys, and plated metals
The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IVđť’ľ WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.
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ZSX Primus IVđť’ľ Overview
Vacuum (partition) system for analyzing liquids
Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.
Improved throughput
Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency.
D-MCA high-speed analysis
The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.
Optical system not easily impacted by sample surface height variations
An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.
Point/mapping analysis
Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity.
Refined SQX analysis
SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever.
Automated center wire cleaning mechanism
The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.
Nitrogen or Helium Flush mechanism
Nitrogen gas can now be used as the atmospheric gas in place of helium. When nitrogen gas is used, the SQX analysis range is 15P to 96Cm. When measuring in nitrogen atmosphere, the standard option “SQX scattering FP method” is not applicable.
ZSX Primus IVđť’ľ Features
ZSX Primus IVđť’ľ Videos
ZSX Primus IVđť’ľ Specifications
| Technique | Wavelength dispersive X-ray fluorescence spectrometer (WDXRF) | |
|---|---|---|
| Benefit | Elemental analysis of solids, liquids, powders, alloys and thin films | |
| Technology | Tube-below sequential WDXRF | |
| Attributes | End window type Rh target 4 or 3 kW, 54-position autosampler, analyze Be to Cm, vacuum | |
| Options | He-flush Additional analyzing crystals r-θ stage/mapping |
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| Computer | External PC, MS Windows OS, ZSX software | |
| Dimensions | 840 (W) x 1440 (H) x 980 (D) mm | |
| Mass | Approx. 600 kg (core unit) | |
| Power requirements | 3-phase 200/208 V 40 A 50/60 Hz | |
ZSX Primus IVđť’ľ Options
The following accessories are available for this product:
Holderless Solution
This option can be added to the ZSX Primus IVi X-ray fluorescence (XRF) spectrometer to automatically transport samples from the ASC (Auto Sample Changer) tray, supporting continuous measurement and automation.
ZSX Primus IVđť’ľ Application Notes
The following application notes are relevant to this product
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XRF1131 - Standardless FP Analysis of Lithium-ion Battery Cathode Material LiFePOâ‚„ by ZSX Primus IV
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BATT0004 - Chemical Composition Analysis of NMC Cathode
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BATT0001 - Battery Material Development
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WDXRF1099 - Trace Element Analysis in Geological Samples by the Pressed Powder Method, using GEO-TRACE-PAK
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WDXRF1085 - Trace Element Analysis for Water Solution by Micro-droplet Method using Ultra Carry Filter Paper
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WDXRF1106 - Sulfur Analysis in Petroleum Products by WDXRF according to ASTM D2622-16
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WDXRF1108 - Sulfur Analysis in Crude Oil and High-sulfur Fuels by WDXRF according to ASTM D2622-16
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WDXRF1102 - Standardless FP Analysis of Plant, Animal and Food Samples Applying Correction by Scattering Line
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WDXRF1084 - Mapping and Small Spot Analysis with a General-Purpose XRF Spectrometer
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WDXRF1105 - Lubricating Oil Analysis by WDXRF According to ASTM D6443-14
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WDXRF1117 - Lead Analysis in Gasoline — ASTM D5059-21 — using WDXRF ZSX Primus IV𝒾
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WDXRF1101 - Fused Bead Analysis for Refractories using Application Package Refractory Series
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WDXRF1100 - Fused Bead Analysis for Wide Concentration Ranges of Various Oxide Materials using OXIDE-FB-PAK
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WDXRF1092 - Fixed Angle Measurement using the Semi-Quantitative Analysis Function SQX of ZSX Guidance Software
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WDXRF1086 - Boron and Fluorine Quantitative Analysis for Water Solution by Micro-droplet Method using Ultra Carry Filter Paper
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WDXRF1091 - Beryllium Analysis in Beryllium Copper Alloy using ZSX Primus IV with RX85
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WDXRF1109 - Automatic Quant Application Setup Applied to Calibrating Coal Fly Ash Fused Beads
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WDXRF1104 - Analysis of S, Fe, Ni and V in Residual Oil According to IP610/13
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WDXRF1107 - Analysis of Low-concentration Sulfur in Petroleum-based Fuels by WDXRF According to ASTM D2622-16
ZSX Primus IVđť’ľ Resources
Webinars
| Analysis of Hazardous Heavy Elements in Soil and Sediment | Watch the Recording |
| A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates | Watch the Recording |
| Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF | Watch the Recording |
Rigaku Journal articles
 Wavelength dispersive X-ray fluorescence spectrometer ZSX Primus IVi |
Read the Article |
| Sample preparation for X-ray fluorescence analysis V. /　Fusion bead method—part 2: practical applications |
Read the Article |
| Sample preparation for X-ray fluorescence analysis IV./ Fusion bead method―part 1 basic principals |
Read the Article |
| Sample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods |
Read the Article |
| Sample preparation for X-ray fluorescence analysis II. Pulverizing methods of powder samples |
Read the Article |
ZSX Primus IVđť’ľ Events
Learn more about our products at these events
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EventDatesLocationEvent website
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33rd International Materials Research Congress (IMRC2025)August 16 2025 - August 20 2025CancĂşn, Mexico
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Webinar: Light Element Analysis With WDXRF - Reliably Quantify Boron and FluorineAugust 18 2025 - August 18 2025Webinar
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FEMS Euromat 2025September 13 2025 - September 17 2025Granada, Spain
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Trollbroken XRF Sweden Conference 2025September 15 2025 - September 16 2025Göteborg, Sweden
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Analitica Latin AmericaSeptember 22 2025 - September 24 2025SĂŁo Paulo, Brazil
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Gulf Coast Conference 2025October 13 2025 - October 14 2025Galveston, TX, United States
Contact Us
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