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ZSX Primus IV𝒾
Features
Assisted measurement and analysis support: ZSX Guidance
Automated analysis settings features enhanced third-generation SQX analysis software
ZSX Guidance software
Built-in XRF expertise handles sophisticated settings. Available application packages enable turn-key operations.
Intuitive software programmable for everyday analysis using sample trays
Sample ID settings for each tray (facilitates easy copy-and-paste for efficient measurement setup).
Improved accuracy of liquid sample analysis
Correction of geometry effect caused by geometry of liquid sample cups.
High-speed, high-precision measurements
Efficiency of the new drive sequence decreases instrument overhead time
Unique functionality
The tube-below optics enables convenient functionality, including new sample film corrections.

In addition to the application notes listed below, these new documents are available for request:

Tube-below sequential wavelength dispersive X-Ray fluorescence spectrometer

Uncompromised X-ray analysis of liquids, alloys, and plated metals

The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV𝒾 WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.

Vacuum (partition) system for analyzing liquids

Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.

Improved throughput

Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency. 

D-MCA high-speed analysis

The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.

Optical system not easily impacted by sample surface height variations

An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.

Point/mapping analysis

Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity. 

Refined SQX analysis

SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever. 

Automated center wire cleaning mechanism

The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.


Learn more about our products at these events

Booth number Date Location Event website
ACA 2021 - Virtual Event Website
Denver X-ray Conference - Virtual Event Website
IUCr XXV - Prague, Czech Republic Website
Thermal Analysis Technical Seminar "Let’s evaluate materials with DSC! Principles, Applications and Tips" Webinar Register
NGAUS 2021 - Las Vegas, NV Website
Ceramics Expo 2021 - Cleveland, OH Website
Aluminum USA 2021 - Louisville, KY Website
IACP 2021 - New Orleans, LA Website
FABTECH 2021 - Chicago, IL Website
CARS Recycling Show H2 - Coventry, UK Website
Thermal Analysis Technical Seminar "Important factors affecting measurement conditions - sample preparation, atmosphere, heating or cooling rate, etc." Webinar Register
ALUMINIUM 2021 11L73 - Dusseldorf, Germany Website
Forum Labo - Paris, France Website
Gulf Coast Conference (GCC 2021) - Galveston, TX Website
AAPS 2021 #1438 - Phildelphia, PA (+Virtual) Website
EASTEC 2021 - West Springfield, MA Website
ACS MWRM 2020 - Springfield, MO Website
CBRNe Convergence 2021 - Orlando, FL Website
ARABLAB 2020 - Dubai, UAE Website
WESTEC 2021 - Long Beach, CA Website
International Chemical & Petroleum Industry Inspection Tech Conference - Sugar Land, TX Website
FABTECH Mexico - Monterrey, Mexico Website
ECM 33 - Versailles , France Website
Labelexpo Americas - Rosemont, IL Website

Upcoming training sessions

Title Dates Cost Location Notes Course outline Registration form
ZSX Primus IV & Supermini200 Online training (Europe) - Please contact ECOE@rigaku.com Online Class outline Online registration form
X-ray fluorescence software and applications training (USA) - $3500 Online Class outline Registration form
ZSX Primus IV & Supermini200 Online training (Europe) - Please contact ECOE@rigaku.com Online Class outline Online registration form