- Analyze oxygen through uranium (O → U)
- Analyze solids, liquids, powders, alloys and thin films
- Atmosphere: helium or vacuum
- X-ray tube: 50 kV, 200 W Pd-anode
- Primary beam filter: Zr is standard; Al optional
- Detectors: scintillation counter and F-PC
(S-PC not requiring P10 gas optionally available)
- Crystals: 3-position changer
- Sample size: able to accommodate 51.5 mm diameter samples
- Automatic sample changer (ASC)
Standard: 10 sample positions (for 51.5 mm diameter samples)
Optional: 12 sample positions (up to 44mm diameter samples)
- Vacuum: rotary pump standard
- Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A
High-power Benchtop Sequential WDXRF Spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
Elemental analysis of oxygen to uranium
Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).
WDXRF performance with low costs
Not only is the Rigaku Supermini200 spectrometer an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.
WDXRF for light element performance
Analyzing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is this instrument's core competency. With its high powered (200 W) X-ray tube, Rigaku Supermini200 delivers high XRF sensitivity for light elements with superior spectral resolution for resolving line overlaps in complex matrices without the need for complicated mathematical peak deconvolution. Analyzing low concentration levels of light elements (F, Na, Mg, Ca, Si, Al, and P) is easy.
Highest resolution for difficult samples
Supermini200 WDXRF spectrometer is equipped with a three position crystal changer where LiF(200) and PET are mounted as standard crystals. RX26, Ge or RX-9 can be added optionally, with the RX9 providing higher sensitivity and resolution for P, S and Cl peaks.