High-resolution benchtop microtomography of large samples
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
200 kV microcomputerized directional industrial X-ray system
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator