Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-resolution benchtop microtomography of large samples
Compact 2D X-ray camera with micron and sub-micron resolution for imaging
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers