200 kV microcomputerized directional industrial X-ray system
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
250 kV microcomputerized directional industrial X-ray system
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.