High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
WDXRF spectrometer designed to handle very large and/or heavy samples
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis