A cost-effective solution for departments looking for targeted chemical threat analysis
Offers features and benefits that maximize chemical threat analysis in safety and security applications
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
Provides presumptive identification of narcotics, precursor chemicals, and cutting agents
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.