A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.