High-resolution benchtop microtomography of large samples
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers