New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films