High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
250 kV microcomputerized directional industrial X-ray system
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Scanning multi-element process coatings analyzers for web or coil applications
Process sulfur analysis by X-ray transmission (X-ray absorption)
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers
Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples