Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples