Skip to main content

SmartLab training (Europe)

SmartLab training RESE
Course Name:   Basic Training Course for SmartLab
Duration:   5-days
Sessions:   15-19 March, 2021
12-16 July, 2021
04-08 October, 2021
Course Times:   9 a.m. – 4 p.m.
Location:   Online


General Scope

This course addresses the basic operations in terms of hardware and software for the SmartLab multi-purpose XRD instrument.  The training is based on hands-on solving of example problems in order to illustrate a range of XRD techniques. Starting from basic general purpose powder X-ray diffraction right through to pole figure, residual stress, SAXS and thin-film X-ray diffraction including X-ray reflectivity, grazing incidence diffraction, in-plane diffraction and high-resolution diffraction using PDXL, 3D Explore and Global Fit software. Previous experience in X-ray diffraction is required. Persons attending the training should expect to leave the course with a basic working knowledge of both the SmartLab hardware and analysis software. Some of the specific topics covered are outlined below.

Rigaku will provide the training notes and a course certificate.

Persons attending the training are advised to have a personal computer with SmartLab Studio II software installed and software dongle / network license that is required to run the software.

E-mail with the details and online training link will be sent to registered attendees prior to the training.

Operators, engineers, research scientists and university students in university and operators of the SmartLab diffractometer supplied by Rigaku

Registration is required. The number of places is limited.

Course Agenda

Day 1
9:00 - 12:00 Theory
1. Introduction
2. XRD basics
3. Sample preparation
SmartLab (SL) hardware (HW) and software (SW)
4. Measurements
13:00 - 16:00 SW
1. Introduction to SLSII
2. Data analysis
a) Basic/data processing
b) Conversion/saving
c) Visualization/graphics
d) Database (COD, ICDD) installation
3. Qualitative
a) RIR
b) Internal/external standards
4. Introduction to the Rietveld Method, WPPF
5. WPPF - exercises
Day 2
9:00 – 12:00 SW
1. Quantitative phase analysis
2. Quantification of amorphous phases
3. Comprehensive analysis
a) Crystallite size determination
4. Crystallite size distribution
13:00 – 16:00 SW
1. Crystal structure solution from powder X-ray data
a) Indexing, space group determination
b) Crystal structure model determination
2. Transmission measurements
3. PDF
Day 3
9:00 - 12:00 Theory
1. Gracing Incidence Diffraction (GID)
2. In-plane diffraction
3. Pole Figure
SL HW and SW
4. GID measurement
5. In-plane measurement
13:00 - 16:00 SL HW and SW
1. PF measurements (0D,2D) measurement & analysis
Theory, HW & SF
2. Residual Stress
3. Residual Stress measurement (0D,2D) & analysis
Day 4
9:00 - 12:00 Theory, HW & SW
13:00 - 16:00 SL HW & SW
2. Microdiffraction (incident optics, camera)
3. In-situ measurements
Day 5
9:00 – 12:00 Theory, HW & SF
1. XRR theory, measurement and analysis
2. RC measurement and analysis
13:00 - 16:00 SL HW & SW
1. RSM measurement and analysis (fast RSM, wide-RSM)
2. Q & A Session
3. Summary of the training
4. Q & A Session
5. Summary of the training

Note: During training course, the latest version of software for instrument control and analysis software that is available on the market is used. Therefore, details of the operation might be different from your environment. Our trainers are available to discuss the operations on your version of the software. In such a case, you are advised to bring your personal computer with software installation and software dongles along with you. 

Please, note, our application scientists are available for discussions or demonstrations of other Rigaku products, e.g. SMX XRD systems or XRF spectrometers, therefore please let us know in advance to schedule these appointments in case of interest.