|What are our students saying about our XRD training sessions?
"Everyone is very helpful and goes out of their way to help"
"The training courses made everything very clear"
"Got me excited about incorporating XRD into my research"
"Instructors are very flexible in adjusting presentations to our interests"
"I'm excited to get home and try new things"
"They are very interested in making the instrument meet my needs"
1-, 2-, 3-, 4-, 5-day, options available. See registration form and class outline for specifics.
DAY ONE (9:00 a.m. to 5:00 p.m.)
- Basic operation of SmartLab diffractometer
- X-ray diffraction and instrumentation
- High resolution XRD for single crystals and epitaxial films
- High resolution XRD method
- High resolution XRD measurement techniques
- High resolution XRD epitaxial layer structure analysis
DAY TWO (9:00 a.m. to 5:00 p.m.)
- X-ray reflectometry
- X-ray reflectometry method
- X-ray reflectometry measurement techniques
- X-ray reflectometry film structure analysis
- In-plane XRD
- In-plane measurement theory
- In-plane grazing incidence XRD thin film measurements
- Grazing incidence XRD
- Traditional grazing incidence XRD thin film measurements
- Rocking Curve and Reciprocal space mapping
- Rocking curve film structure analysis
- Small angle X-ray scattering
- Small angle X-ray scattering method
- Small angle X-ray scattering measurement techniques
- Small angle X-ray scattering particle size analysis
DAY THREE AM (9:00 a.m. to 5 p.m.)
- Powder diffraction
- Powder diffraction method
- How to select right geometry and measurement conditions
- Understanding sources of errors
- Residual stress
- Residual stress measurement techniques
- Residual stress analysis
- Pole figure
- Pole figure measurement techniques
- Pole figure preferred orientation analysis
DAY FOUR (9:00 a.m. to 5:00 p.m.)
- PDXL / SmartLab Studio II powder plugin details
- Basic powder diffraction data treatment
- Search/Match: Identifying phases, tools and techniques to aid your search
- Profile Fitting techniques/ crystallite size/ % crystallinity (if appropriate)
- Easy Quant using RIR relative intensity ratio method
- Easy quant using calibration curves
- Whole Pattern Fitting/ Rietveld analysis—quantitation
DAY FIVE (9:00 a.m. to 5:00 p.m.)
- Overview of Rietveld Basic Operations
- Specific Topics also covered
- Background Model Parameters-polynomial versus user defined backgrounds
- Interpretations of statistical and graphical displays of refinements
- Refinement operation using structure-less phases
- Automatic atomic coordinates linking (cif, csf)
- Internal standard calibrations for 2θ reference
- Easy instrument properties modification- sample displacement shift theta compensating slits, thin film absorption, cylindrical specimen, etc.
- Solid solution substitutions and site occupancy refinements
- Rotating 3-D structure viewing and stereo projections
- Interactive links to Search/Match for residual unmatched area
- Constraints on Variables
- Multiple data regions can be excluded (i.e. Sample holder or substrate reflections)
- Preferred orientations corrections
- Individual FWHM profile shape fitting for turbostatic effects.
- Lattice/crystal structure parameters
- Selective use of phases in refinement (phases included or excluded from refinements)
Customer site software and instrument training course:
- Convenience of your own site for training
- Custom designed to accommodate your instrument
- Custom designed to cater to your staff
- From two to five days of individual attention from expert trainers
Please contact Michelle Goodwin at (281) 362-2300 ext. 122 to schedule training today!