NANOHUNTER II
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Total reflection X-ray fluorescence (TXRF)
Trace elemental analyses of beverages and biological materials by TXRF spectrometry
Winter 2019 Volume 35, No. 1
Atsushi Ohbuchi and Hikari Takahara
Total reflection of X-rays occurs on the surface of a measured object by X-ray irradiation at an extremely low glancing
The Nobel prize in physics 2014
Winter 2015 Volume 31, No. 1
Katsuhiko Inaba
Incandescent light bulbs lit the 20th century but the 21st century will be lit by LED lamps—thanks to discoveries recognized
TXRF-V310
Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers
TXRF310Fab
Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers
TXRF 3800e
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.
Benchtop total reflection XRF spectrometer
Winter 2016 Vol.32 No.1
X-ray fluorescence spectrometry (XRF) is well known as an analysis method with high precision by means of non-destructive and no
TXRF 3760
Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.
Liquid analysis by total reflection X-ray fluorescence spectrometer
Summer 2016 Volume 33, No. 2
Kazuaki Okuda
Total Reflection X-ray Fluorescence (TXRF) is a method that can be used for high sensitive elemental analysis on solid sample
Total reflection X-ray fluorescence spectrometer TXRF 3800e
Winter 2012, Volume 28, No. 1
Total reflection X-ray fluorescence (TXRF) spectrometry is widely used in semiconductor manufacturing processes for nondestructive analyses of metallic contamination on
