High-resolution benchtop microtomography of large samples
Foreign object X-ray inspection instrument
300 kV microcomputerized directional industrial X-ray system
Ultra-high resolution nanotomography using parallel beam geometry
250 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
High-speed, stationary sample microtomography of large samples
200 kV microcomputerized directional industrial X-ray system