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The Onyx ED-XRF: High-Speed Analysis of Micron-scale Features and Devices

The Onyx ED-XRF: High-Speed Analysis of Micron-scale Features and Devices

 

Join in to learn how micro-spot ED-XRF is used to analyze thin film properties and surface chemistry with micron-scale accuracy, and how the uniquely hybridized optical-microscopy and XRF sensor technologies of the Onyx deliver rapid, high-impact data with ease.

This talk, given by Brad Lawrence of Rigaku, will highlight the utility of micron-scale beam spot in ED-XRF and showcase example applications which demonstrate the Onyx’s specialized advantages for semiconductor and device manufacturing and processing.

Presenter
Brad Lawrence hosted by Covalent Metrology
Date/time (CDT)